2000


Lateral Injection Lasers

Authors: E. H. Sargent, J. M. Xu
Volume/Number: book chapter in Advances in Semiconductor Lasers, M. Stroscio and M. Dutta (Eds.), pp. 95-132
Year: 2000

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Photoelectric Phenomena in Polymer-based Composites

Authors: A. Shik, H. Ruda, E. H. Sargent
Volume/Number: Volume / Number: Journal of Applied Physics, vol. 88, pp. 3448-53
Year: 2000

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Influence of Nonuniform Carrier Distribution on the Polarization Dependence of Modal Gain in Multiquantum-Well Lasers and Semiconductor Optical Amplifiers

Authors: D. Ban, E. H. Sargent
Volume/Number: Volume / Number: IEEE Journal of Quantum Electronics, vol. 36, pp. 1081-1088
Year: 2000

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Nonlinear Disordered Media for Broadband Optical Limiting

Authors: L. Brzozowski and E. H. Sargent
Volume/Number: Volume / Number: IEEE Journal of Quantum Electronics, vol. 36, pp. 1237-1242
Year: 2000

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Lighting the Local Area: Optical Code-Division Multiple-Access and Quality of Service Provisioning

Authors: A. Stok and E. H. Sargent
Volume/Number: Volume / Number: IEEE Network, vol. 14, pp. 42-46
Year: 2000

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Nonlinear Distributed Feedback Structures as Passive Optical Limiter

Authors: L. Brzozowski and E.H. Sargent
Volume/Number: Volume / Number: Journal of Optical Society of America B, vol. 17, pp. 1360-1365
Year: 2000

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Transmission Regimes of Periodic Nonlinear Optical Structures

Authors: D. Pelinovsky, L. Brzozowski and E. H. Sargent
Volume/Number: Volume / Number: Physical Review E, vol. 60, pp. R4536-R4539
Year: 2000

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Optical Signal Processing Using Nonlinear Distributed Feedback Structures

Authors: L. Brzozowski, E. H. Sargent
Volume/Number: Volume / Number: IEEE Journal of Quantum Electronics, vol. 36, pp. 550-555
Year: 2000

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Above-threshold Leakage in Semiconductor Lasers: An Analytical Physical Model

Authors: M. P. Aarts, E. H. Sargent
Volume/Number: Volume / Number: IEEE Journal of Quantum Electronics, vol.36, pp. 496-501
Year: 2000

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Semiconductor Lasers for Planar Integrated Optoelectronics

Authors: E. H. Sargent
Volume/Number: Volume / Number: Solid-State Electronics vol. 44, pp. 147-173
Year: 2000

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